Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn)Si dispersoid
نویسندگان
چکیده
A Xe plasma Focussed Ion Beam instrument was used to prepare in-situ specimens for Atom Probe Tomography from a bulk sample of an aluminium 6XXX alloy. The nature and distribution precipitates solute clusters observed in the alloy are not differ between standard electropolishing methods preparation. Enabled by site specific specimen preparation, analysis α-Al(Fe,Mn)Si dispersoid shows segregation at phase boundary shell dispersoid.
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ژورنال
عنوان ژورنال: Materials Characterization
سال: 2021
ISSN: ['1044-5803', '1873-4189']
DOI: https://doi.org/10.1016/j.matchar.2021.111194